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Appendix A - ATmega88/168 Automotive Specification at 150C
This document contains information specific to devices operating at temperatures up to 150C. Only deviations are covered in this appendix, all other information can be found in the complete Automotive datasheet. The complete Automotive datasheet can be found on www.atmel.com
8-bit Microcontroller with 8K Bytes In-System Programmable Flash ATmega88/168 Automotive Appendix A
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1. Electrical Characteristics
1.1 Absolute Maximum Ratings
Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Parameters Operating Temperature Storage Temperature Voltage on any Pin except RESET with respect to Ground Voltage on RESET with respect to Ground Maximum Operating Voltage DC Current per I/O Pin DC Current VCC and GND Test Conditions -55 to +150 -65 to +175 -0.5 to VCC+0.5 -0.5 to +13.0 6.0 30 200.0 Unit C C V V V mA
1.2
DC Characteristics
Test Conditions VCC = 2.7V to 5.5V VCC = 2.7V to 5.5V VCC = 2.7V to 5.5V VCC = 2.7V to 5.5V VCC = 2.7V to 5.5V VCC = 2.7V to 5.5V Symbol VIL VIH VIL1 VIH1 VIL2 VIH2 Min. -0.5 0.6VCC(2) -0.5 0.7VCC(2) -0.5 0.9VCC(2) Typ. Max. +0.3VCC(1) VCC + 0.5 +0.1VCC(2) VCC + 0.5 +0.2VCC(1) VCC + 0.5 Unit V V V V V V
TA = -40C to +150C, VCC = 2.7V to 5.5V (unless otherwise noted) Parameters Input Low Voltage, except XTAL1 and RESET pin Input High Voltage, except XTAL1 and RESET pins Input Low Voltage, XTAL1 pin Input High Voltage, XTAL1 pin Input Low Voltage, RESET pin Input High Voltage, RESET pin Notes:
1. "Max" means the highest value where the pin is guaranteed to be read as low 2. "Min" means the lowest value where the pin is guaranteed to be read as high 3. Although each I/O port can sink more than the test conditions (20 mA at VCC = 5V) under steady state conditions (non-transient), the following must be observed: 1] The sum of all IOL, for all ports, should not exceed 400 mA. 2] The sum of all IOL, for ports C0 - C5, should not exceed 200 mA. 3] The sum of all IOL, for ports C6, D0 - D4, should not exceed 300 mA. 4] The sum of all IOL, for ports B0 - B7, D5 - D7, should not exceed 300 mA. If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test condition. 4. Although each I/O port can source more than the test conditions (20 mA at VCC = 5V) under steady state conditions (non-transient), the following must be observed: 1] The sum of all IOH, for all ports, should not exceed 400 mA. 2] The sum of all IOH, for ports C0 - C5, should not exceed 200 mA. 3] The sum of all IOH, for ports C6, D0 - D4, should not exceed 300 mA. 4] The sum of all IOH, for ports B0 - B7, D5 - D7, should not exceed 300 mA. If IOH exceeds the test condition, VOH may exceed the related specification. Pins are not guaranteed to source current greater than the listed test condition. 5. Minimum VCC for Power-down is 2.5V
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1.2 DC Characteristics (Continued)
Test Conditions VCC = 2.7V to 5.5V VCC = 2.7V to 5.5V IOL = 20 mA, VCC = 5V IOL = 5 mA, VCC = 3V IOH = -20 mA, VCC = 5V IOH = -10 mA, VCC = 3V VCC = 5.5V, pin low (absolute value) VCC = 5.5V, pin high (absolute value) Symbol VIL3 VIH3 VOL VOH IIL IIH RRST RPU Active 4 MHz, VCC = 3V Active 8MHz, VCC = 5V Power Supply Current(5) Active 16 MHz, VCC = 5V Idle 4 MHz, VCC = 3V Idle 8 MHz, VCC = 5V Idle 16 MHz, VCC = 5V Power-down mode WDT enabled, VCC = 3V WDT enabled, VCC = 5V WDT disabled, VCC = 3V WDT disabled, VCC = 5V VCC = 5V Vin = VCC/2 VCC = 5V Vin = VCC/2 VCC = 4.0V ICC PWD ICC IDLE ICC 30 20 4.0 2.2 1 1 60 50 8 16 25 6 12 14 90 140 80 120 < 10 -50 500 40 +50 Min. -0.5 0.6VCC(2) Typ. Max. +0.3VCC(1) VCC + 0.5 0.8 0.5 Unit V V V V A A k k mA mA mA mA A A mV nA ns TA = -40C to +150C, VCC = 2.7V to 5.5V (unless otherwise noted) Parameters Input Low Voltage, RESET pin as I/O Input High Voltage, RESET pin as I/O Output Low Voltage(3), I/O pin except RESET Output High Voltage(4) I/O pin except RESET Input Leakage Current I/O Pin Input Leakage Current I/O Pin Reset Pull-up Resistor I/O Pin Pull-up Resistor
Analog Comparator Input Offset Voltage Analog Comparator Input Leakage Current Analog Comparator Propagation Delay Notes:
VACIO IACLK tACPD
1. "Max" means the highest value where the pin is guaranteed to be read as low 2. "Min" means the lowest value where the pin is guaranteed to be read as high 3. Although each I/O port can sink more than the test conditions (20 mA at VCC = 5V) under steady state conditions (non-transient), the following must be observed: 1] The sum of all IOL, for all ports, should not exceed 400 mA. 2] The sum of all IOL, for ports C0 - C5, should not exceed 200 mA. 3] The sum of all IOL, for ports C6, D0 - D4, should not exceed 300 mA. 4] The sum of all IOL, for ports B0 - B7, D5 - D7, should not exceed 300 mA. If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test condition. 4. Although each I/O port can source more than the test conditions (20 mA at VCC = 5V) under steady state conditions (non-transient), the following must be observed: 1] The sum of all IOH, for all ports, should not exceed 400 mA. 2] The sum of all IOH, for ports C0 - C5, should not exceed 200 mA. 3] The sum of all IOH, for ports C6, D0 - D4, should not exceed 300 mA. 4] The sum of all IOH, for ports B0 - B7, D5 - D7, should not exceed 300 mA. If IOH exceeds the test condition, VOH may exceed the related specification. Pins are not guaranteed to source current greater than the listed test condition. 5. Minimum VCC for Power-down is 2.5V
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1.3
Memory Endurance
EEPROM endurance: 50,000 Write/Erase cycles. Flash endurance: 10,000 Write/Erase cycles.
1.4
Maximum Speed versus VCC
Maximum frequency is dependent on VCC. As shown in Figure 1-1, the Maximum Frequency vs. VCC curve is linear between 2.7V < VCC < 4.5V. Figure 1-1. Maximum Frequency vs. VCC
16 MHz
8 MHz
Safe Operating Area
2.7V
4.5V
5.5V
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)
1.5
ADC Characteristics(1)
Test Conditions Symbol Min Typ 10 2 3.5 Max Unit Bits LSB
TA = -40C to +150C, VCC = 4.5V to 5.5V (unless otherwise noted) Parameters Resolution VREF = 4V, VCC = 4V, Absolute accuracy (Including ADC clock = 200 kHz INL, DNL, quantization error, VREF = 4V, VCC = 4V, gain and offset error) ADC clock = 200 kHz Noise Reduction Mode Integral Non-Linearity (INL) Differential Non-Linearity (DNL) Gain Error Offset Error Conversion Time Clock Frequency Analog Supply Voltage Reference Voltage Input Voltage Input Bandwidth Internal Voltage Reference Reference Input Resistance Analog Input Resistance Note: VINT RREF RAIN 1.0 25.6 AVCC VREF VIN VREF = 4V, VCC = 4V, ADC clock = 200 kHz VREF = 4V, VCC = 4V, ADC clock = 200 kHz VREF = 4V, VCC = 4V, ADC clock = 200 kHz VREF = 4V, VCC = 4V, ADC clock = 200 kHz Free Running Conversion 13 cycles 50 VCC - 0.3 1.0 GND 38.5 1.1 32 100 1.2 38.4 200 VCC + 0.3 AVCC VREF -3.5
2
3.5
LSB
0.6 0.30 -1.3 1.8
2.5 1.0 +3.5 3.5
LSB LSB LSB LSB s kHz V V V kHz V k M
1. Based on standard voltage range (2.7V to 5.5V) characterization results. To be confirmed after actual silicon characterization.
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2. ATmega88/168 Typical Characteristics
2.1 Active Supply Current
Figure 2-1. Active Supply Current versus Frequency (1 MHz to 20 MHz)
16 14 12 5.5V 5.0V 10 8 6 4 2 0 0 2 4 6 8 10 12 14 16 18 20 3.3V 3.0V
ICC (mA)
Frequency (MHz)
Figure 2-2.
Idle Supply Current versus Frequency (1 MHz to 20 MHz)
8
6
ICC (mA)
4
5.5V 5.0V 3.3V 3.0V
2
0 4 6 8 10 12 14 16 18 20
Frequency (MHz)
2.2
Power-Down Supply Current
Figure 2-3. Power-down Supply Current versus VCC (Watchdog Timer Disabled)
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Figure 2-4. Power-down Supply Current versus VCC (Watchdog Timer Enabled)
35 30 25
150C
ICC (A)
20 15 10 5 0 2.5
125C -40C 85C 25C
3
3.5
4
4.5
5
5.5
VCC (V)
2.3
Pin Pull-up
Figure 2-5. I/O Pin Pull-up Resistor Current versus Input Voltage (VCC = 5V)
160
150C
140 120
IOP (A)
100 80 60 40 20 0 0
-40C
1
2
3
4
5
6
VOP (V)
Figure 2-6.
Output Low Voltage versus Output Low Current (VCC = 5V)
0.8 0.7 0.6
150C 125C 85C 25C -40C
VOL (V)
0.5 0.4 0.3 0.2 0.1 0 0 2 4 6 8 10 12 14 16 18 20
IOL (mA)
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Figure 2-7.
Output Low Voltage versus Output Low Current (VCC = 3V)
1.4 1.2 1.0
150C 125C 85C 25C -40C
VOL (V)
0.8 0.6 0.4 0.2 0 0 2 4 6 8 10 12 14 16 18 20
IOL (mA)
Figure 2-8.
Output High Voltage versus Output High Current (VCC = 5V)
5.2 5.0 4.8
VOH (V)
4.6 4.4 4.2 4 0 2 4 6 8 10 12 14 16 18
-40C 25C 85C 125C 150C
20
IOH (mA)
Figure 2-9.
Output High Voltage versus Output High Current (VCC = 3V)
3.5 3.0 2.5
-40C 25C 85C 125C 150C
Current (V)
2.0 1.5 1.0 0.5 0 0 2 4 6 8 10 12 14 16 18
20
IOH (mA)
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Figure 2-10. Reset Pull-up Resistor Current versus Reset Pin Voltage (VCC = 5V)
140 120
150C
IRESET (A)
100 80 60 40 20 0 0 1 2 3 4 5 6
-40C
VRESET (V)
2.4
Pin Thresholds and Hysteresis
Figure 2-11. I/O Pin Input Threshold versus VCC (VIH, I/O Pin Read as `1')
3 2.5 2.0
150C -40C
VIH (V)
1.5 1.0 0.5 0
2.5
3
3.5
4
4.5
5
5.5
VCC (V)
Figure 2-12. I/O Pin Input Threshold versus VCC (VIL, I/O Pin Read as `0')
3 2.5 2.0
150C -40C
VIL (V)
1.5 1.0 0.5 0 2.5 3 3.5 4 4.5 5 5.5
VCC (V)
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Figure 2-13. Reset Input Threshold Voltage versus VCC (VIH, Reset Pin Read as `1')
3 2.5
Threshold (V)
2.0
-40C
1.5 1.0 0.5 0 2.5
150C
3
3.5
4
4.5
5
5.5
VCC (V)
Figure 2-14. Reset Input Threshold Voltage versus VCC (VIL, Reset Pin Read as `0')
2.5
2.0
Threshold (V)
1.5
150C -40C
1.0 0.5
0
2.5
3
3.5
4
4.5
5
5.5
VCC (V)
2.5
Internal Oscillator Speed
Figure 2-15. Watchdog Oscillator Frequency versus VCC
190 170 150 130 110 90 70 -40 -30 -20 -10 0 10 2.7V 3.0V 5.0V 5.5V
FRC (kHz)
20 30
40 50 60 70
80 90 100 110 120 130 140 150 160
Temperature
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Figure 2-16. Calibrated 8 MHz RC Oscillator Frequency versus Temperature
8.4 8.3 8.2
5.5V 5.0V 4.5V 3.3V 3.0V 2.7V
FRC (MHz)
8.1 8.0 7.9 7.8 7.7 7.6 -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100 110 120 130 140 150
Temperature
Figure 2-17. Calibrated 8 MHz RC Oscillator Frequency versus VCC
8.4 8.3 8.2
150C 125C 85C 25C -40C
FRC (MHz)
8.1 8.0 7.9 7.8 7.7 7.6 2 2.5 3 3.5 4 4.5 5 5.5
6
VCC (V)
Figure 2-18. Calibrated 8 MHz RC Oscillator Frequency versus OSCCAL Value
16 14 12
150C -40C
FRC (MHz)
10 8 6 4 2 0 0 16 32 48 64 80 96 112 128 144 160 176 192 208 224 240 256
OSCCAL (X1)
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2.6
BOD Thresholds and Analog Comparator Offset
Figure 2-19. BOD Threshold versus Temperature (BODLEVEL is 4.0V)
4.6 4.5
Threshold (V)
4.4
1
4.3 4.2
0
4.1 4.0 -50 -40 -30 -20 -10 0
10 20 30 40 50 60 70 80 90 100 110 120 130 140 150 160
Temperature (C)
Figure 2-20. BOD Threshold versus Temperature (BODLEVEL is 2.7V)
3.0 2.9
Threshold (V)
2.8
1
2.7 2.6
0
2.5 2.4 -50 -40 -30 -20 -10 0
10 20 30 40 50 60 70 80 90 100 110 120 130 140 150 160
Temperature (C)
Figure 2-21. Bandgap Voltage versus VCC
1.25 1.20 1.15 1.10 1.05 1.00 0.95
150C -40C
Bandgap Voltage (V)
2
2.5
3
3.5
4
4.5
5
5.5
VCC (V)
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2.7 Peripheral Units
Figure 2-22. Analog to Digital Converter GAIN versus VCC
0
-0.5
Error (LSB)
-1.0 -1.5
4 IDL
4 STD
-2.0 -2.5 -50 -25 0 25 50 75 100 125 150
Temperature
Figure 2-23. Analog to Digital Converter OFFSET versus VCC
2.5 2.0
4 IDL 4 STD
Error (LSB)
1.5
1.0 0.5 0 -50 -25 0 25 50 75 100 125 150
Temperature
Figure 2-24. Analog to Digital Converter DNL versus VCC
1.0 0.9 0.8
Error (LSB)
0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 -50 -25 0 25 50 75 100 125 150
4 IDL 4 STD
Temperature
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Figure 2-25. Analog to Digital Converter INL versus VCC
1.0 0.9 0.8
Error (LSB)
0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 -50 -25 0 25 50 75 100 125 150
4 IDL 4 STD
Temperature
2.8
Grade 0 Qualification
The ATmega88/168 has been developed and manufactured according to the most stringent quality assurance requirements of ISO-TS-16949 and verified during product qualification as per AEC-Q100 grade 0. AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature field usage however may result in less significant stress test acceleration. In order to prevent the risk that ATmega88/168 lifetime would not satisfy the application end-of-life reliability requirements, Atmel(R) has extended the testing, whenever applicable (High Temperature Operating Life Test, High Temperature Storage Life, Data Retention, Thermal Cycles), far beyond the AEC-Q100 requirements. Thereby, Atmel verified the ATmega88/168 has a long safe lifetime period after the grade 0 qualification acceptance limits. The valid domain calculation depends on the activation energy of the potential failure mechanism that is considered. Examples are given in Figure 2-26. Therefore any temperature mission profile which could exceed the AEC-Q100 equivalence domain shall be submitted to Atmel for a thorough reliability analysis Figure 2-26. AEC-Q100 Lifetime Equivalence
1000000
100000
10000
Hours
1000
100
10
1 0 20 40 60 80 100 120 140 160
Temperature (C)
HTOL 0.59eV HTSL 0.45eV
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3. Ordering Information
Table 3-1.
Speed (MHz) 16(2) 16(2) 16 16 Notes:
(2) (2)
ATmega88/168
Power Supply 2.7V to 5.5V 2.7V to 5.5V 2.7V to 5.5V 2.7V to 5.5V Ordering Code ATmega88-15MT2 ATmega88-15AD ATmega168-15MD ATmega168-15AD Package(1) PN MA PN MA Operation Range Extended (-40 C to +150 C) Extended (-40 C to +150 C) Extended (-40 C to +150 C) Extended (-40 C to +150 C)
1. Pb-free packaging, complies to the European Directive for Restriction of Hazardous Substances (RoHS directive). Also Halide free and fully Green. 2. For Speed vs. Vcc, see complete datasheet.
4. Package Information
Table 4-1. Package Types
Package Type PN MA 32-pad, 5 x 5 x 1.0 mm body, lead pitch 0.50 mm, Quad Flat No-Lead/Micro Lead Frame Package (QFN/MLF): E2/D2 3.1 0.1 mm 32 - Lead, 7 x 7 mm Body Size, 1.0 mm Body Thickness 0.8 mm Lead Pitch, Thin Profile Plastic Quad Flat Package (TQFP)
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Figure 4-1.
PN
16
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Figure 4-2. MA
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5. Revision History
Please note that the following page numbers referred to in this section refer to the specific revision mentioned, not to this document. Revision No. 7607H-AVR-02/10 7607G-AVR-07/09 7607F-AVR-01/08 7607E-AVR-11/07 History * Table 4-1 "Package Types" on page 15 changed * Package MA updated * Added memory endurance. See Section 1.3 "Memory Endurance" on page 4 * Added ATMega168 product offering * Added MA package offering * Updated electrical characteristics * Removed Grade0 qualification section * Updated product part number in ordering information * Ordering and package information updated * Added typical characteristics * Document Creation
7607D-AVR-03/07 7607C-AVR-09/06 7607B-AVR-08/06 7607A-AVR-01/06
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Headquarters
Atmel Corporation 2325 Orchard Parkway San Jose, CA 95131 USA Tel: 1(408) 441-0311 Fax: 1(408) 487-2600
International
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Product Contact
Web Site www.atmel.com Technical Support avr@atmel.com Sales Contact www.atmel.com/contacts
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